IC power dissipation consists of standby and active leakage components. The active component is dominated by the switching or dynamic power component. In addition, the standby component can be made significantly smaller than the active component by changing the body bias condition or by power gating.
Reducing supply voltage is one way to help optimizing the power consumption. However, it will lead to slower current drive of the transistor.
Reducing supply voltage means reducing the VG or the gate voltage. Thus, due to the square component the current drive is substantially lowered too. However, we can also lower down the threshold voltage of the transistor. This is because the ON-state of the transistor is achieved when:
VGS > Vth, where Vth is the threshold voltage of the transistor.
The threshold voltage, in turn, can be controlled by body bias voltage as shown in below equation. VSB is the source-to-body substrate bias. Normally, it is a negative value, so the more negative the back bias voltage, the higher the threshold voltage will be.
That leads to harder criteria for transistor to turn-on. Another way of reducing the threshold voltage is by thinning the oxide (related to the gamma sign in the equation).
One penalty, though, in reducing the threshold voltage is the increase in sub-threshold current as shown in the figure below.
The ISUB is thus determined by an equation that looks like the IDS current equation itself, except for several exponential numbers.
Out of several possible reasons in the high IOFF. The sub-threshold current dominates as the technology node shrinks.
In addition, the sub-threshold current increases with temperature. This is the reason why testing IDDQ at high temperature can aggravate the soft-defects especially in catching non-uniform oxide thickness issue.
Cheers,
Pungky
Reducing supply voltage is one way to help optimizing the power consumption. However, it will lead to slower current drive of the transistor.

VGS > Vth, where Vth is the threshold voltage of the transistor.
The threshold voltage, in turn, can be controlled by body bias voltage as shown in below equation. VSB is the source-to-body substrate bias. Normally, it is a negative value, so the more negative the back bias voltage, the higher the threshold voltage will be.
That leads to harder criteria for transistor to turn-on. Another way of reducing the threshold voltage is by thinning the oxide (related to the gamma sign in the equation).
One penalty, though, in reducing the threshold voltage is the increase in sub-threshold current as shown in the figure below.
The ISUB is thus determined by an equation that looks like the IDS current equation itself, except for several exponential numbers.
Out of several possible reasons in the high IOFF. The sub-threshold current dominates as the technology node shrinks.
In addition, the sub-threshold current increases with temperature. This is the reason why testing IDDQ at high temperature can aggravate the soft-defects especially in catching non-uniform oxide thickness issue.
Cheers,
Pungky